Optosky ATP5000 Series Deep Ultraviolet Spectrometers
Miniature Modular Spectrometers

Optosky ATP5000 Series Deep Ultraviolet Spectrometers

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Optosky's ATP5000 series of miniature, high sensitivity spectrometers are particularly suited to low light level, ultraviolet (UV) sensitive applications such as fluorescence, DNA sequencing and Raman analysis.

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Model Wavelength Range (nm) Pixel Number Integration time Price
ATP5020P-DUV-VIS 200-850 2048 x 64 10ms-15min PoR
ATP5020P-DUV-VIS-NIR Extended 193-1008 2048 x 64 10ms-15min PoR
ATP5020P-DUV-VIS-IR 200-1000 2048 x 64 10ms-15min PoR
ATP5020P-DUV 200-400 2048 x 64 10ms-15min PoR
ATP5020P-NIR 600-1000 2048 x 64 10ms-15min PoR
ATP5020P-IR 800-1000 2048 x 64 10ms-15min PoR
ATP5040-IR 800-1000 4096 1ms-80s PoR
ATP5040-NIR 600-1000 4096 1ms-80s PoR
ATP5040-DUV-VIS-NIR 200-1000 4096 1ms-80s PoR
ATP5040-DUV-VIS 200-850 4096 1ms-80s PoR
ATP5040-DUV 200-400 4096 1ms-80s PoR
ATP5040-DUV-VIS-IR Extended 193-1008 4096 1ms-80s PoR

Summary Box

Optosky's ATP5000 series of miniature, high sensitivity spectrometers are particularly suited to low light level, ultraviolet (UV) sensitive applications such as fluorescence, DNA sequencing and Raman analysis.

Description:

The ATP5020/5040 miniature spectrometers feature back-thinned charge coupled device (CCD) area image sensors which offer high UV response, great signal-to-noise characteristics and wide dynamic range, making them especially suited to low light level applications.

The ATP5020P is a high-performance refridgerating micro-fiber spectrometer using a 2048x64 pixel cooled linear CCD. The CCD can work in a set constant temperature environment (up to 5oC), which greatly reduces the noise of the sensor and achieves excellent signal-to-noise ratio.

  • Back-thinned CCD detector
  • High UV sensitivity
  • Optical resolution: 0.01-3nm (depending on slit)
  • SNR: >8000:1
  • Spectral coverage: 180-1100nm
  • Integration time: 2ms-1300s
  • ADC resolution: 18bit
  • ADC sampling rate: 570kHz

Specifications:

Model Wavelength Range (nm) Detector Type Entrance slits (µm) Integration Time Number of Pixels Dark Noise Optical Resolution Dynamic Range Signal to Noise Ratio Scan rate
ATP5020P-DUV-VIS-IR
193-1008 Cooled CCD model s10420+TEC or s11850 5, 10, 25, 50, 100 or 200 µm available 10ms-15min 2048 x 64 6 e-rms
0.1-3 nm 5000:1 >600:1 <100fps
ATP5020P-DUV 200-400 Cooled CCD model s10420+TEC or s11850 5, 10, 25, 50, 100 or 200 µm available 10ms-15min 2048 x 64 6 e-rms 0.1-3 nm 5000:1 >600:1 <100fps
ATP5020P-DUV-VIS 200-850 Cooled CCD model s10420+TEC or s11850 5, 10, 25, 50, 100 or 200 µm available 10ms-15min 2048 x 64 6 e-rms 0.1-3 nm 5000:1 >600:1 <100fps
ATP5020P-DUV-VIS-NIR 200-1000 Cooled CCD model s10420+TEC or s11850 5, 10, 25, 50, 100 or 200 µm available 10ms-15min 2048 x 64 6 e-rms 0.1-3 nm 5000:1 >600:1 <100fps
ATP5020P-NIR 600-1000 Cooled CCD model s10420+TEC or s11850 5, 10, 25, 50, 100 or 200 µm available 10ms-15min 2048 x 64 6 e-rms 0.1-3 nm 5000:1 >600:1 <100fps
ATP5020P-IR 800-1000 Cooled CCD model s10420+TEC or s11850 5, 10, 25, 50, 100 or 200 µm available 10ms-15min 2048 x 64 6 e-rms 0.1-3 nm 5000:1 >600:1 <100fps
ATP5040-DUV-VIS- IR 193-1008 s13496 +TEC 5, 10, 25, 50, 100 or 200 µm available 1ms-80s 4096 0.4mVrms 0.1-3 nm 5000:1 >600:1 <1 kfps
ATP5040-DUV 200-400 s13496 +TEC 5, 10, 25, 50, 100 or 200 µm available 1ms-80s 4096 0.4mVrms 0.1-3 nm 5000:1 >600:1 <1 kfps
ATP5040- DUV-VIS 200-850 s13496 +TEC 5, 10, 25, 50, 100 or 200 µm available 1ms-80s 4096 0.4mVrms 0.1-3 nm 5000:1 >600:1 <1 kfps
ATP5040-DUV-VIS-NIR 200-1000 s13496 +TEC 5, 10, 25, 50, 100 or 200 µm available 1ms-80s 4096 0.4mVrms 0.1-3 nm 5000:1 >600:1 <1 kfps
ATP5040-NIR 600-1000 s13496 +TEC 5, 10, 25, 50, 100 or 200 µm available 1ms-80s 4096 0.4mVrms 0.1-3 nm 5000:1 >600:1 <1 kfps
ATP5040-IR 800-1000 s13496 +TEC 5, 10, 25, 50, 100 or 200 µm available 1ms-80s 4096 0.4mVrms 0.1-3 nm 5000:1 >600:1 <1 kfps

 

Downloads:

ATP5020P Series Datasheet.pdf

ATP5020/5040 Series Datasheet.pdf


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